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X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500 XRD Analyzer

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X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500 XRD Analyzer

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Brand Name :Lonroy
Model Number :AL-Y3500
Certification :CE, ISO
Place of Origin :China
MOQ :1
Price :Negotaible
Payment Terms :L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability :200
Delivery Time :5-8 work days
Packaging Details :wooden package
Rated Power :2kW
Voltage :10~50kV
Stability :≤0.01%
Warranty :1 Year
Model :AL-Y3500
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X-ray Diffractometer Multi-functional Nanomaterials Testing Equipment AL-Y3500 XRD Analyzer

Description:

The combined multi-functional X-ray diffractometer AL-Y3500 is a high-performance and high-precision domestic X-ray diffractometer in China, which is a project selected through competitive bidding by the National Development and Reform Commission. It is applied in various fields of material structure analysis. The materials that can be analyzed include: metallic materials, inorganic materials, composite materials, organic materials, nanomaterials, superconducting materials; and the material states include: powder samples, block samples, thin film samples, micro-area and micro-amount samples.

It is widely applied in the fields of clay minerals, cement building materials, environmental dust, chemical products, medicines, asbestos, rocks and minerals, polymers, etc.


Features:

1.The perfect integration of the hardware system and the software system meets the needs of scholars and researchers in various application fields.

2.High-precision diffraction angle measurement system, providing more accurate measurement results.

3.The highly stable X-ray generator control system ensures more stable repeat measurement accuracy.

4.Various functional accessories meet the needs of different testing purposes.

5.Programmed operation, integrated structural design, easy to operate and with a more attractive instrument appearance.

6.Identification of one or more crystal phases in unknown samples.

7.Quantitative analysis of the known phases in the mixed sample.

8.Crystal structure analysis (Rietveld structure analysis).

9.Crystalline structure changes under unconventional conditions (at high and low temperatures).

10.Analysis of thin film samples, including the crystal phase of the film, the thickness of multilayer films, surface roughness, and charge density.

11.Analysis of micro-area samples.

12.Metal material texture and stress analysis.


Technical Parameter

Customized Support

OEM, ODM

Place of Origin

Guangdong, China

Power

2KW

Warranty

1 Year

Brand Name

Lonroy

Model Number

AL-Y3500

Rated Power

2 kW

Electric Current

5~40mA

Voltage

10~50kV

Stability

≤0.01%

X-ray Tube

Metal ceramic X-ray tube

Certificate

CE, ISO


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