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Roughness Contour Compound Testing Machine Contour Measurement Equipment Roughness Profilometer

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City:dongguan
Province/State:guangdong
Country/Region:china
Contact Person:MsKaitlyn Wang
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Roughness Contour Compound Testing Machine Contour Measurement Equipment Roughness Profilometer

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Brand Name :Lonroy
Model Number :LR-A091
Certification :CE ISO ASTM
Place of Origin :China
MOQ :1
Price :Negotaible
Payment Terms :L/C,D/A,D/P,T/T,Western Union,MoneyGram
Supply Ability :200
Delivery Time :5-8 work days
Packaging Details :wooden package
Measuring Range :±420 μm
Resolution :65536:1
Indication Accuracy :≤±(8 nm + 3.5%)
Warranty :1year
Measuring Speed :2 mm/s
Repeatability :1δ≤1.5 nm
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Roughness Contour Compound Testing Machine Contour Measurement Equipment Roughness Profilometer

Description

The roughness profile composite machine is a high-precision measuring instrument. It is based on an independent dual-sensor design and can simultaneously meet the requirements of roughness and profile measurement.

Based on the innovative design of independent dual sensors, through precise coordination and optimized configuration, each sensor can fully demonstrate its unique advantages in its specific field, promoting the complementarity among the sensors and providing users with the best possible usage experience.

The sensor switching is convenient. The ingenious mechanical structure design enables the contour sensor and the roughness sensor to be interchangeable more quickly and easily.


Technical Parameters

Measuring Range

X-axis

120-220 mm

X-axis Resolution

0.1 μm

Z-axis

420 mm, 620 mm (optional)

Profile Sensor

Z1-axis Measuring Range

30-60 mm (optional)

Z1 Resolution

0.02 μm

Profile Accuracy

Z1 Linear Accuracy

≤±(0.6 +|0.02H|)μm

Circular Arc

±(1.5 + R/12) μm

Angle

±1′

Straightness

0.5 μm/100 mm (cut-off wavelength 0.8)

Measuring Speed

2 mm/s

Roughness Sensor

Measuring Range

±420 μm

Resolution

65536:1

Roughness Accuracy

Indication Accuracy

≤±(8 nm + 3.5%)

Residual Noise

≤0.008 μm

Repeatability

1δ≤1.5 nm

Cut-off Wavelength

0.025, 0.08, 0.25, 0.8, 2.5, 8 mm

Evaluation Length

λC×2, 3, 4, 5, 6, 7


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